"An economically designed Sequential Probability Ratio Test control chart ..."

Pengwei Zhang et al. (2014)

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DOI: 10.1016/J.CIE.2014.10.002

access: closed

type: Journal Article

metadata version: 2020-02-20

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Pengwei Zhang, Qin Su, Chenglong Li, Tiantian Wang:
An economically designed Sequential Probability Ratio Test control chart for short-run production. Comput. Ind. Eng. 78: 74-83 (2014)

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