"Deep transfer Wasserstein adversarial network for wafer map defect ..."

Jianbo Yu et al. (2021)

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DOI: 10.1016/J.CIE.2021.107679

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type: Journal Article

metadata version: 2022-12-07

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Jianbo Yu, Shijin Li, Zongli Shen, Shijin Wang, Changhui Liu, Qingfeng Li:
Deep transfer Wasserstein adversarial network for wafer map defect recognition. Comput. Ind. Eng. 161: 107679 (2021)

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