"An effective defect inspection system for polarized film images using ..."

Young-Geun Yoon et al. (2008)

> Home

Details and statistics

DOI: 10.1016/J.CIE.2008.01.015

access: closed

type: Journal Article

metadata version: 2020-02-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/candie/YoonLCK08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/candie/YoonLCK08
Young-Geun Yoon, Seok-Lyong Lee, Chin-Wan Chung, Sang-Hee Kim:
An effective defect inspection system for polarized film images using image segmentation and template matching techniques. Comput. Ind. Eng. 55(3): 567-583 (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.