"Edge computing-based unified condition monitoring system for process ..."

Hui Xiao et al. (2023)

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DOI: 10.1016/J.CIE.2023.109032

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type: Journal Article

metadata version: 2024-05-07

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Hui Xiao, Wenshan Hu, Guoping Liu, Hong Zhou:
Edge computing-based unified condition monitoring system for process manufacturing. Comput. Ind. Eng. 177: 109032 (2023)

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