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"Sample-imbalanced wafer map defects classification based on auxiliary ..."

Jialin Li et al. (2024)

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DOI: 10.1016/J.CIE.2024.110209

access: closed

type: Journal Article

metadata version: 2024-07-04

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Jialin Li, Ran Tao, Renxiang Chen, Yongpeng Chen, Chengying Zhao, Xianzhen Huang:
Sample-imbalanced wafer map defects classification based on auxiliary classifier denoising diffusion probability model. Comput. Ind. Eng. 192: 110209 (2024)

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