"An ANN approach for modeling the multisource yield learning process with ..."

Toly Chen (2017)

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DOI: 10.1016/J.CIE.2016.11.021

access: closed

type: Journal Article

metadata version: 2024-05-07

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Toly Chen:
An ANN approach for modeling the multisource yield learning process with semiconductor manufacturing as an example. Comput. Ind. Eng. 103: 98-104 (2017)

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