"Development of expert decision model to monitor precision of solar silicon ..."

Che-Wei Chang, Chung-Chih Chen (2010)

> Home

Details and statistics

DOI: 10.1016/J.CIE.2010.05.008

access: closed

type: Journal Article

metadata version: 2020-02-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/candie/ChangC10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/candie/ChangC10
Che-Wei Chang, Chung-Chih Chen:
Development of expert decision model to monitor precision of solar silicon wafer machine line. Comput. Ind. Eng. 59(4): 481-487 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.