"Risks of rapid application development."

Ritu Agarwal et al. (2000)

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DOI: 10.1145/352515.352516

access: closed

type: Journal Article

metadata version: 2019-10-19

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Ritu Agarwal, Jayesh Prasad, Mohan Tanniru, John Lynch:
Risks of rapid application development. Commun. ACM 43(11es): 1 (2000)

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