"Wafer map defect patterns classification based on a lightweight network ..."

Naigong Yu et al. (2023)

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DOI: 10.1049/CIT2.12126

access: open

type: Journal Article

metadata version: 2024-04-01

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  - https://dblp.org/rec/journals/caaitrit/YuCXHO23
Naigong Yu, Huaisheng Chen, Qiao Xu, Mohammad Mehedi Hasan, Sié Ouattara:
Wafer map defect patterns classification based on a lightweight network and data augmentation. CAAI Trans. Intell. Technol. 8(3): 1029-1042 (2023)

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