"Reliability growth and forecasting for critical hardware through ..."

Pablo E. Acevedo, Donald S. Jackson, Robert W. Kotlowitz (2006)

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DOI: 10.1002/BLTJ.20183

access: closed

type: Journal Article

metadata version: 2020-02-27

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Pablo E. Acevedo, Donald S. Jackson, Robert W. Kotlowitz:
Reliability growth and forecasting for critical hardware through accelerated life testing. Bell Labs Tech. J. 11(3): 121-135 (2006)

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