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"Bisous model - Detecting filamentary patterns in point processes."
Elmo Tempel et al. (2016)
- Elmo Tempel, Radu S. Stoica, Rain Kipper, Enn Saar:
Bisous model - Detecting filamentary patterns in point processes. Astron. Comput. 16: 17-25 (2016)
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