"Few-shot defect detection using feature enhancement and image generation ..."

Yu Gong et al. (2024)

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DOI: 10.1007/S10489-023-05199-8

access: closed

type: Journal Article

metadata version: 2024-07-18

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Yu Gong, Mingzhou Liu, Xiaoqiao Wang, Conghu Liu, Jing Hu:
Few-shot defect detection using feature enhancement and image generation for manufacturing quality inspection. Appl. Intell. 54(11-12): 375-397 (2024)

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