"Measurement and Defect Modeling for a Legacy Software System."

Joel Troster, Jeff Tian (1995)

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DOI: 10.1007/BF02249047

access: closed

type: Journal Article

metadata version: 2020-09-17

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Joel Troster, Jeff Tian:
Measurement and Defect Modeling for a Legacy Software System. Ann. Softw. Eng. 1: 95-118 (1995)

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