"An exploration of combinatorial testing-based approaches to fault ..."

Ludwig Kampel et al. (2022)

> Home

Details and statistics

DOI: 10.1007/S10472-021-09772-0

access: closed

type: Journal Article

metadata version: 2022-11-18

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/amai/KampelSKK22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/amai/KampelSKK22
Ludwig Kampel, Dimitris E. Simos, D. Richard Kuhn, Raghu N. Kacker:
An exploration of combinatorial testing-based approaches to fault localization for explainable AI. Ann. Math. Artif. Intell. 90(7-9): 951-964 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.