"Efficient Defect Identification via Oxide Memristive Crossbar Array Based ..."

Hee Sung Lee et al. (2021)

> Home

Details and statistics

DOI: 10.1002/AISY.202000202

access: open

type: Journal Article

metadata version: 2023-11-12

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/aisy/LeeBLCPLKL21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/aisy/LeeBLCPLKL21
Hee Sung Lee, Yongmin Baek, Qiubao Lin, Joseph Minsu Chen, Minseong Park, Doeon Lee, Sihwan Kim, Kyusang Lee:
Efficient Defect Identification via Oxide Memristive Crossbar Array Based Morphological Image Processing. Adv. Intell. Syst. 3(2): 2000202 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.