"Margin-based approach for outlier detection of industrial design data ..."

Jayaram Sivaramakrishnan et al. (2022)

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DOI: 10.1017/S0890060421000329

access: closed

type: Journal Article

metadata version: 2022-03-15

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  - https://dblp.org/rec/journals/aiedam/Sivaramakrishnan22
Jayaram Sivaramakrishnan, Gareth Lee, David Parlevliet, Kok Wai Wong:
Margin-based approach for outlier detection of industrial design data using a modified general regression neural network. Artif. Intell. Eng. Des. Anal. Manuf. 36: e7 (2022)

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