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"Application of a Bayesian network to integrated circuit tester diagnosis."

Daniel Mittelstadt, Robert Paasch, Bruce D'Ambrosio (1995)

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DOI: 10.1017/S0890060400002080

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/aiedam/MittelstadtPD95
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  - https://dblp.org/rec/journals/aiedam/MittelstadtPD95
Daniel Mittelstadt, Robert Paasch, Bruce D'Ambrosio:
Application of a Bayesian network to integrated circuit tester diagnosis. Artif. Intell. Eng. Des. Anal. Manuf. 9(1): 51-65 (1995)

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