"A fault-tolerant approach to test control utilizing dual-redundant processors."

Richard W. Dabney, Letha H. Etzkorn, Glenn W. Cox (2008)

> Home

Details and statistics

DOI: 10.1016/J.ADVENGSOFT.2007.03.010

access: closed

type: Journal Article

metadata version: 2020-02-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/aes/DabneyEC08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/aes/DabneyEC08
Richard W. Dabney, Letha H. Etzkorn, Glenn W. Cox:
A fault-tolerant approach to test control utilizing dual-redundant processors. Adv. Eng. Softw. 39(5): 371-383 (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.