"A deep learning framework under attention mechanism for wheat yield ..."

Huiren Tian et al. (2021)

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DOI: 10.1016/J.JAG.2021.102375

access: open

type: Journal Article

metadata version: 2023-11-21

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Huiren Tian, Pengxin Wang, Kevin Tansey, Dong Han, Jingqi Zhang, Shuyu Zhang, Hongmei Li:
A deep learning framework under attention mechanism for wheat yield estimation using remotely sensed indices in the Guanzhong Plain, PR China. Int. J. Appl. Earth Obs. Geoinformation 102: 102375 (2021)

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