"A new approach to the design of built-in internal memory self-testing devices."

A. A. Ivanyuk, V. N. Yarmolik (2008)

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DOI: 10.3103/S0146411608040019

access: closed

type: Journal Article

metadata version: 2020-05-11

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A. A. Ivanyuk, V. N. Yarmolik:
A new approach to the design of built-in internal memory self-testing devices. Autom. Control. Comput. Sci. 42(4): 169-174 (2008)

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