"Impact of P/E Stress on Trap Profiles in Bandgap-Engineered Tunneling ..."

Gilsang Yoon et al. (2022)

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DOI: 10.1109/ACCESS.2022.3182397

access: open

type: Journal Article

metadata version: 2023-12-26

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Gilsang Yoon, Donghyun Go, Jounghun Park, Donghwi Kim, Jungsik Kim, Jeong-Soo Lee:
Impact of P/E Stress on Trap Profiles in Bandgap-Engineered Tunneling Oxide of 3D NAND Flash Memory. IEEE Access 10: 62423-62428 (2022)

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