"RAPID: Redundancy Analysis With Parallelized and Intelligent Distribution."

Younwoo Yoo et al. (2025)

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DOI: 10.1109/ACCESS.2024.3523940

access: open

type: Journal Article

metadata version: 2025-01-14

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Younwoo Yoo, Hayoung Lee, Seung Ho Shin, Sungho Kang:
RAPID: Redundancy Analysis With Parallelized and Intelligent Distribution. IEEE Access 13: 2089-2100 (2025)

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