"Simulation of Total Ionizing Dose (TID) Effects Mitigation Technique for ..."

Gangping Yan et al. (2020)

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DOI: 10.1109/ACCESS.2020.3018714

access: open

type: Journal Article

metadata version: 2020-09-19

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Gangping Yan, Jinshun Bi, Gaobo Xu, Kai Xi, Bo Li, Linjie Fan, Huaxiang Yin:
Simulation of Total Ionizing Dose (TID) Effects Mitigation Technique for 22 nm Fully-Depleted Silicon-on-Insulator (FDSOI) Transistor. IEEE Access 8: 154898-154905 (2020)

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