"Hybrid Feature Selection for Wafer Acceptance Test Parameters in ..."

Hongwei Xu et al. (2020)

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DOI: 10.1109/ACCESS.2020.2966520

access: open

type: Journal Article

metadata version: 2020-02-07

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Hongwei Xu, Jie Zhang, Youlong Lv, Peng Zheng:
Hybrid Feature Selection for Wafer Acceptance Test Parameters in Semiconductor Manufacturing. IEEE Access 8: 17320-17330 (2020)

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