"Design of a Highly Robust Triple-Node-Upset Self-Recoverable Latch."

Hui Xu et al. (2021)

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DOI: 10.1109/ACCESS.2021.3104335

access: open

type: Journal Article

metadata version: 2021-09-01

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Hui Xu, Cong Sun, Le Zhou, Huaguo Liang, Zhengfeng Huang:
Design of a Highly Robust Triple-Node-Upset Self-Recoverable Latch. IEEE Access 9: 113622-113630 (2021)

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