"A New Test Algorithm and Fault Simulator of Simplified Three-Cell Coupling ..."

Tiancheng Wu et al. (2024)

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DOI: 10.1109/ACCESS.2024.3439626

access: open

type: Journal Article

metadata version: 2024-08-22

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Tiancheng Wu, Weikang Fan, Yuefeng Gu, Feifan Fan, Qiuhong Li:
A New Test Algorithm and Fault Simulator of Simplified Three-Cell Coupling Faults for Random Access Memories. IEEE Access 12: 109218-109229 (2024)

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