"Quantitative Hot Carrier Injection Analysis of N-Type Tunnel Field-Effect ..."

Jae Seung Woo, Jang Woo Lee, Woo Young Choi (2023)

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DOI: 10.1109/ACCESS.2023.3243578

access: open

type: Journal Article

metadata version: 2023-02-25

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Jae Seung Woo, Jang Woo Lee, Woo Young Choi:
Quantitative Hot Carrier Injection Analysis of N-Type Tunnel Field-Effect Transistors. IEEE Access 11: 14943-14950 (2023)

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