"A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, ..."

Pedram Tabatabaeemoshiri et al. (2025)

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DOI: 10.1109/ACCESS.2025.3535103

access: open

type: Journal Article

metadata version: 2025-03-07

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Pedram Tabatabaeemoshiri, Narendra Kumar, Anis Salwa Mohd Khairuddin, Daniel Ting, Vivek Regeev:
A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL). IEEE Access 13: 21678-21694 (2025)

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