"Carrier Lifetime Dependence on Temperature and Proton Irradiation in ..."

Giovanna Sozzi et al. (2024)

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DOI: 10.1109/ACCESS.2024.3405382

access: open

type: Journal Article

metadata version: 2024-07-04

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Giovanna Sozzi, Sergio Sapienza, Giovanni Chiorboli, Lasse Vines, Anders Hallén, Roberta Nipoti:
Carrier Lifetime Dependence on Temperature and Proton Irradiation in 4H-SiC Device: An Experimental Law. IEEE Access 12: 74230-74238 (2024)

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