"Hyperspectral In-Situ Monitoring for Deep Learning-Based Anomaly ..."

Charles Snyers et al. (2024)

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DOI: 10.1109/ACCESS.2024.3507370

access: open

type: Journal Article

metadata version: 2025-01-08

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Charles Snyers, Julien Ertveldt, Kyriakos Efthymiadis, Jan Helsen:
Hyperspectral In-Situ Monitoring for Deep Learning-Based Anomaly Classification in Metal Additive Manufacturing. IEEE Access 12: 178848-178861 (2024)

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