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"LETS: A Label-Efficient Training Scheme for Aspect-Based Sentiment ..."

Heereen Shim et al. (2021)

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DOI: 10.1109/ACCESS.2021.3101867

access: open

type: Journal Article

metadata version: 2021-10-14

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Heereen Shim, Dietwig Lowet, Stijn Luca, Bart Vanrumste:
LETS: A Label-Efficient Training Scheme for Aspect-Based Sentiment Analysis by Using a Pre-Trained Language Model. IEEE Access 9: 115563-115578 (2021)

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