"A Review of Knowledge-Based Defect Identification via PRPD Patterns in ..."

Tohid Shahsavarian et al. (2021)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2021.3082858

access: open

type: Journal Article

metadata version: 2021-06-15

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/ShahsavarianPZP21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/ShahsavarianPZP21
Tohid Shahsavarian, Yue Pan, Zhousheng Zhang, Cheng Pan, Hadi Naderiallaf, Jim Guo, Chuanyang Li, Yang Cao:
A Review of Knowledge-Based Defect Identification via PRPD Patterns in High Voltage Apparatus. IEEE Access 9: 77705-77728 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.