"Lifetime Reliability Improvement of Nano-Scale Digital Circuits Using Dual ..."

Mohsen Raji et al. (2021)

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DOI: 10.1109/ACCESS.2021.3103200

access: open

type: Journal Article

metadata version: 2021-09-01

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Mohsen Raji, Reza Mahmoudi, Behnam Ghavami, Saeed Keshavarzi:
Lifetime Reliability Improvement of Nano-Scale Digital Circuits Using Dual Threshold Voltage Assignment. IEEE Access 9: 114120-114134 (2021)

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