"Recent Developments in Negative Capacitance Gate-All-Around Field Effect ..."

Laixiang Qin et al. (2023)

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DOI: 10.1109/ACCESS.2023.3243697

access: open

type: Journal Article

metadata version: 2023-09-04

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Laixiang Qin, Chunlai Li, Yiqun Wei, Guoqing Hu, Jingbiao Chen, Yi Li, Caixia Du, Zhangwei Xu, Xiumei Wang, Jin He:
Recent Developments in Negative Capacitance Gate-All-Around Field Effect Transistors: A Review. IEEE Access 11: 14028-14042 (2023)

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