"Demystifying Defects: Federated Learning and Explainable AI for ..."

Tanish Patel et al. (2024)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2024.3425226

access: open

type: Journal Article

metadata version: 2024-09-20

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/PatelMYJSG24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/PatelMYJSG24
Tanish Patel, Ramalingam Murugan, Gokul Yenduri, Rutvij H. Jhaveri, Hichem Snoussi, Tarek Gaber:
Demystifying Defects: Federated Learning and Explainable AI for Semiconductor Fault Detection. IEEE Access 12: 116987-117007 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.