"Toward Optimal Defect Detection in Assembled Printed Circuit Boards Under ..."

Mohammad Noroozi et al. (2023)

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DOI: 10.1109/ACCESS.2023.3330142

access: open

type: Journal Article

metadata version: 2023-12-10

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Mohammad Noroozi, Jalal Ghadermazi, Ankit Shah, José L. Zayas-Castro:
Toward Optimal Defect Detection in Assembled Printed Circuit Boards Under Adverse Conditions. IEEE Access 11: 127119-127131 (2023)

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