"Optimal Test Clock Frequency Based Test Option Generation for Small Delay ..."

Prathiba Muthukrishnan, Sivanantham Sathasivam (2023)

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DOI: 10.1109/ACCESS.2023.3321323

access: open

type: Journal Article

metadata version: 2023-11-09

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Prathiba Muthukrishnan, Sivanantham Sathasivam:
Optimal Test Clock Frequency Based Test Option Generation for Small Delay Defects. IEEE Access 11: 115556-115567 (2023)

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