"Contamination Detection From Highly Cluttered Waste Scenes Using Computer ..."

Dishant Mewada et al. (2024)

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DOI: 10.1109/ACCESS.2024.3456469

access: open

type: Journal Article

metadata version: 2024-10-06

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Dishant Mewada, Cathaoir Agnew, Eoin Martino Grua, Ciarán Eising, Patrick Denny, Mark Heffernan, Ken Tierney, Pepijn van de Ven, Anthony G. Scanlan:
Contamination Detection From Highly Cluttered Waste Scenes Using Computer Vision. IEEE Access 12: 129434-129446 (2024)

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