"Reliability Analysis of Baremetal and FreeRTOS Applications on Microchip ..."

André Martins Pio de Mattos, Douglas A. dos Santos, Luigi Dilillo (2025)

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DOI: 10.1109/ACCESS.2024.3524726

access: open

type: Journal Article

metadata version: 2025-02-14

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André Martins Pio de Mattos, Douglas A. dos Santos, Luigi Dilillo:
Reliability Analysis of Baremetal and FreeRTOS Applications on Microchip PolarFire SoC RISC-V Multiprocessors Using High-Energy Protons. IEEE Access 13: 19922-19936 (2025)

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