"Analysis of SET Reconvergence and Hardening in the Combinational Circuit ..."

Chang Liu et al. (2018)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2018.2867639

access: open

type: Journal Article

metadata version: 2020-03-05

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/LiuZHG18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/LiuZHG18
Chang Liu, Long Zhang, Xu He, Yang Guo:
Analysis of SET Reconvergence and Hardening in the Combinational Circuit Using a SAT-Based Method. IEEE Access 6: 48740-48746 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.