"Wafer Region Yield Prediction: Employing Majority Under-Sampling and ..."

Martin Ying Song Lim, Anurag Sharma, Cheng Siong Chin (2025)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2025.3554525

access: open

type: Journal Article

metadata version: 2025-04-08

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/LimSC25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/LimSC25
Martin Ying Song Lim, Anurag Sharma, Cheng Siong Chin:
Wafer Region Yield Prediction: Employing Majority Under-Sampling and Output Binarization on Low-Yield Threshold. IEEE Access 13: 55104-55112 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.