"Degradation Mechanisms of Gate Leakage in GaN-Based HEMTs at Low Dose Rate ..."

Xiaolong Li et al. (2024)

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DOI: 10.1109/ACCESS.2024.3368870

access: open

type: Journal Article

metadata version: 2024-03-16

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Xiaolong Li, Xin Wang, Mohan Liu, Kunfeng Zhu, Guohua Shui, Qiwen Zheng, Jiangwei Cui, Wu Lu, Yudong Li, Qi Guo:
Degradation Mechanisms of Gate Leakage in GaN-Based HEMTs at Low Dose Rate Irradiation. IEEE Access 12: 35410-35416 (2024)

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