"A Secure JTAG Wrapper for SoC Testing and Debugging."

Kuen-Jong Lee, Zheng-Yao Lu, Shih-Chun Yeh (2022)

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DOI: 10.1109/ACCESS.2022.3164712

access: open

type: Journal Article

metadata version: 2022-04-27

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Kuen-Jong Lee, Zheng-Yao Lu, Shih-Chun Yeh:
A Secure JTAG Wrapper for SoC Testing and Debugging. IEEE Access 10: 37603-37612 (2022)

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