"Enhanced Anomaly Detection in Manufacturing Processes Through Hybrid Deep ..."

Kyung Sung Lee, Seong Beom Kim, Hee-Woong Kim (2023)

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DOI: 10.1109/ACCESS.2023.3308698

access: open

type: Journal Article

metadata version: 2023-09-14

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Kyung Sung Lee, Seong Beom Kim, Hee-Woong Kim:
Enhanced Anomaly Detection in Manufacturing Processes Through Hybrid Deep Learning Techniques. IEEE Access 11: 93368-93380 (2023)

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