"Fuzzability Testing Framework for Incomplete Firmware Binary."

Jiwon Jang et al. (2023)

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DOI: 10.1109/ACCESS.2023.3297888

access: open

type: Journal Article

metadata version: 2023-08-18

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Jiwon Jang, Gyeongjin Son, Hyeonsu Lee, Heesun Yun, Deokjin Kim, Sangwook Lee, Seongmin Kim, Daehee Jang:
Fuzzability Testing Framework for Incomplete Firmware Binary. IEEE Access 11: 77608-77619 (2023)

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