"Deep Learning and Computer Vision Techniques for Enhanced Quality Control ..."

Md Raisul Islam et al. (2024)

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DOI: 10.1109/ACCESS.2024.3453664

access: open

type: Journal Article

metadata version: 2025-01-24

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Md Raisul Islam, Md. Zakir Hossain Zamil, Md Eshmam Rayed, Md. Mohsin Kabir, Muhammad Firoz Mridha, Satoshi Nishimura, Jungpil Shin:
Deep Learning and Computer Vision Techniques for Enhanced Quality Control in Manufacturing Processes. IEEE Access 12: 121449-121479 (2024)

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