"Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node ..."

Jonghyeon Ha et al. (2023)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2023.3312016

access: open

type: Journal Article

metadata version: 2023-10-14

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/HaBLSKK23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/HaBLSKK23
Jonghyeon Ha, Minji Bang, Gyeongyeop Lee, Minki Suh, Chong-Eun Kim, Jungsik Kim:
Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node Nanosheet FET 6T Static Random Access Memory. IEEE Access 11: 97682-97688 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.