"Neg/pos-Normalized Accuracy Measures for Software Defect Prediction."

Maohua Gan, Zeynep Yücel, Akito Monden (2022)

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DOI: 10.1109/ACCESS.2022.3232144

access: open

type: Journal Article

metadata version: 2023-01-15

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Maohua Gan, Zeynep Yücel, Akito Monden:
Neg/pos-Normalized Accuracy Measures for Software Defect Prediction. IEEE Access 10: 134580-134591 (2022)

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