"A Light-Weighted CNN Model for Wafer Structural Defect Detection."

Xiaoyan Chen et al. (2020)

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DOI: 10.1109/ACCESS.2020.2970461

access: open

type: Journal Article

metadata version: 2022-04-01

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Xiaoyan Chen, Jianyong Chen, Xiaoguang Han, Chundong Zhao, Dongyang Zhang, Kuifeng Zhu, Yanjie Su:
A Light-Weighted CNN Model for Wafer Structural Defect Detection. IEEE Access 8: 24006-24018 (2020)

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