"Mutation-Based White Box Testing of Deep Neural Networks."

Gökhan Çetiner, Ugur Yayan, Ahmet Yazici (2024)

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DOI: 10.1109/ACCESS.2024.3482114

access: open

type: Journal Article

metadata version: 2024-12-22

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Gökhan Çetiner, Ugur Yayan, Ahmet Yazici:
Mutation-Based White Box Testing of Deep Neural Networks. IEEE Access 12: 160156-160174 (2024)

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